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Fault tolerant and fault testable hardware design

By: Lala, Parag K.
Publisher: Hyderabad : BS Publications, 1990Description: 263 p. ; ill., 24 cm.ISBN: 9788178000381.Subject(s): Electronic digital computers | Reliability | Fault-tolerant computing | Boolean differences | Built-in test | Checking experiment | D-Algorithm | Distingishing sequence | Hybrid redundancy | JPL-STAR | Level-sensitive scan design | N-modular redundancy | Orthogonal Latin squares | Reed-Muller expansion | Self-testing | Totally self-checking checkers | Unidirectional fault | Watching timer | PODEMDDC classification: 621.3819
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Item type Current location Call number Status Date due Barcode
Books 621.3819 LAL (Browse shelf) Checked out 15/12/2024 033465

Includes bibliographical references and index.

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